ECCV 2012 - LNCS 7572-7578 and 7583-7585

A Parameterless Line Segment and Elliptical Arc Detector with Enhanced Ellipse Fitting

Viorica Ptrucean^{1, 2}, Pierre Gurdjos¹, and Rafael Grompone von Gioi³

¹IRIT-ENSEEIHT, Toulouse, France
viorica.patraucean@enseeiht.fr
pierre.gurdjos@enseeiht.fr

²Military Technical Academy of Bucharest, Romania

³CMLA, ENS Cachan, France
grompone@cmla.ens-cachan.fr

Abstract. We propose a combined line segment and elliptical arc detector, which formally guarantees the control of the number of false positives and requires no parameter tuning. The accuracy of the detected elliptical features is improved by using a novel non-iterative ellipse fitting technique, which merges the algebraic distance with the gradient orientation. The performance of the detector is evaluated on computer-generated images and on natural images.

Keywords: ellipse detection, a contrario approach, ellipse fitting

LNCS 7573, p. 572 ff.

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